We investigated the properties of polycrystalline silicon (poly-Si) films formed by the flash lamp annealing (FLA) of hydrogenated amorphous Si (a-Si:H) films. Phosphorus- (P-) doped a-Si films with a thickness of several micrometers deposited by catalytic chemical vapor deposition (Cat-CVD) on a silicon nitride- (SiNx-) coated textured glass substrate are crystallized films by FLA. P doping was achieved by flowing phosphine (PH3) during Cat-CVD, and the P concentration was controlled within a range of 1016–1021 cm−3, which was measured by secondary ion mass spectrometry (SIMS). We also fabricated simple back-contact Si heterojunction solar cells to estimate a potential of flash-lamp-crystallized (FLC) poly-Si as an absorption layer. The current-density–voltage (J–V) characteristics of the cells measured under 1 sun light irradiation show an open-circuit voltage (VOC) of > 0.4 V. This indicates that the FLC poly-Si films may be used like other poly-Si films in solar cell devices.