1985
DOI: 10.1080/00150198508225992
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Crystallization of amorphous lead-titanate prepared by a sol-gel process

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Cited by 67 publications
(13 citation statements)
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“…The shifting of XRD peaks toward lower angle side for x = 0.10 sample could be attribute to the high strain [16] which is generated because of smaller crystallite size of x = 0.10 sample. This result agrees well with other reports for similar materials [17,18]. The coherently scattered crystallite size and lattice strain of the samples were calculated from the X'Pert HighScore software using Scherrer's equation (p hkl .…”
Section: Resultsmentioning
confidence: 57%
“…The shifting of XRD peaks toward lower angle side for x = 0.10 sample could be attribute to the high strain [16] which is generated because of smaller crystallite size of x = 0.10 sample. This result agrees well with other reports for similar materials [17,18]. The coherently scattered crystallite size and lattice strain of the samples were calculated from the X'Pert HighScore software using Scherrer's equation (p hkl .…”
Section: Resultsmentioning
confidence: 57%
“…Since the phase transformation of pyrochlore to perovskite also occurred homogeneously, the following reaction applies: [9] dXpy/dt = K 2 Xpv (4) where Xpy is the volume fraction of the pyrochlore. The rate of the pyrochlore accumulation, dXpy/dt, in the film was equal to the difference between the rate of formation from amorphous phase, -dXA/dt, and the rate of transformation into perovskite, dXpv/dt: dXpy/dt = -dXA]dt -dXpv/dt (5) By integration, the volume fraction of the transition pyrochlore, Xpy, and the volume fraction of the perovskite, Xpv, at time t were determined by: …”
Section: A -"mentioning
confidence: 99%
“…In the sol-gel and metallo-organic processing, low temperature processed materials were obtained and then converted to ceramics by calcination at high temperatures. During crystallization of sol-gel derived ceramics, metastable or transitional phases are often observed prior to the formation of the final stable phases [2,4]. Therefore, the crystallization process is usually not a single step transformation process.…”
Section: Introductionmentioning
confidence: 99%
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“…A PZT precursor of morphotropic composition, x=0.53, was made according to the modified 2-methoxyethanol route described by Gurkovich and Blum [19] and Budd et al [20] For seeding a similar 0.11 M precursor corresponding to PbTiO 3 was made with 30% Pb excess to enhance seed layer orientation and to avoid problems related to lead evaporation. The CSD seed layer was deposited on a platinized silicon wafer (Pt/TiO 2 /SiO 2 /Si) using spin coating at 3,000 rpm for 40 s. The film was subsequently pyrolyzed at 350°C for 60 s to evaporate the solvent and pyrolyze the organics after which the seed layer was crystallized at 650°C for 60 s. A 2 μm PZT film was deposited on the seeded wafer using a procedure already described in literature [1].…”
Section: Methodsmentioning
confidence: 99%