Crystallographic orientation dependence of radiation damage in Ga-ion irradiated Ni-based alloy processed by a focused ion beam

Micromechanical tensile test investigation to identify elastic and toughness properties of thin nitride compound layers

“…Note that the thickness of the studied nitride layer was less than 10 µm, which made it impossible to obtain thicker samples. However, usual TEM investigations suggest that the thickness of metallic materials affected by the ion beam is usually less than 30 nm which is still very small compared to the section of the current micro-specimens [34].…”