2007
DOI: 10.1116/1.2779042
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Cs Br ∕ Ga N heterojunction photoelectron source

Abstract: Formation of cesium peroxide and cesium superoxide on InP photocathode activated by cesium and oxygenNegative electron affinity group III-nitride photocathode demonstrated as a high performance electron source Experimental results on a new CsBr/ GaN heterojunction photocathode structure are presented. The results indicate a fourfold improvement in photoyield relative to CsBr/ Cr photocathodes. A model is presented based on intraband states in CsBr and electron injection from the GaN ͑with 1% addition of indium… Show more

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Cited by 9 publications
(8 citation statements)
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“…This initial behavior is expected from the creation of color centers in the material and the transfer of Cs to the surface as described in Refs. [3][4][5][6], and differs from the UV surface cleaning shown in Fig. 1 samples was measured before coating.…”
Section: Resultsmentioning
confidence: 99%
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“…This initial behavior is expected from the creation of color centers in the material and the transfer of Cs to the surface as described in Refs. [3][4][5][6], and differs from the UV surface cleaning shown in Fig. 1 samples was measured before coating.…”
Section: Resultsmentioning
confidence: 99%
“…In the case of CsBr=GaN photocathodes, due to the better alignment of the conduction bands of CsBr and GaN substrate, the direct electron injections from the GaN substrate through the CsBr film are enhanced. Thus CsBr=GaN cathodes offer a large enhancement in the quantum efficiency relative to CsBr=Cr photocathodes [5,6].…”
Section: Introductionmentioning
confidence: 99%
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“…The GaN photocathode structure 5 consists of a 100 nm thick GaN layer, p-type 1 ϫ 10 18 cm −3 ͑Mg doped͒ and an AlN buffer layer 500 Å thick molecular beam epitaxy grown on a c-axis double side polished sapphire substrate ͑0.5 mm thick͒. The GaN photocathode structure 5 consists of a 100 nm thick GaN layer, p-type 1 ϫ 10 18 cm −3 ͑Mg doped͒ and an AlN buffer layer 500 Å thick molecular beam epitaxy grown on a c-axis double side polished sapphire substrate ͑0.5 mm thick͒.…”
Section: Sample Preparationmentioning
confidence: 99%
“…Robust CsBr photoemitters have been demonstrated and characterized, and they show significant promise for multiple electron-beam systems. [2][3][4][5] The virtual source size of an electron source is determined by the size of the emission area. Therefore, the laser spot, which controls the size of the photoemission area, determines the virtual source size.…”
Section: Introductionmentioning
confidence: 99%