CT image reconstruction via industrial CT fast scanning
Lijuan Bai,
Yirou Du,
Chao Long
Abstract:In automated manufacturing and safety inspection, there is a
high demand for fast computed tomography (CT) scanning and image
reconstruction. Currently, faster scanning can be achieved by
reducing the X-ray exposure time within sparse view CT. The faster
scanning strategy introduces significant streak artefacts and noise
during the sampling process. Consequently, streak artefacts and
noise need to be simultaneously suppressed, which is poses a
challenge for existing reconstruction methods. This p… Show more
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