2006
DOI: 10.1007/11008514_20
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Cu-Mg-Sn (Copper - Magnesium - Tin)

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Cited by 1 publication
(2 citation statements)
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“…EDX detected percentages that are lower than 5% were not taken into consideration due to detection limitation and potential errors and artefacts. References n° 38 and 39 were respectively used as references for interpretation and phase identification in the Cu-Mg-Si and Cu-Mg-Sn ternary phase diagrams.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…EDX detected percentages that are lower than 5% were not taken into consideration due to detection limitation and potential errors and artefacts. References n° 38 and 39 were respectively used as references for interpretation and phase identification in the Cu-Mg-Si and Cu-Mg-Sn ternary phase diagrams.…”
Section: Resultsmentioning
confidence: 99%
“…The spatial resolution corresponding to this voltage (E 0 = 15 keV) and to the density of the material used (ρ = 3.11 g cm -3 ) is = 0.064 ( 0 1.68 − c 1.68 ) ≈ 2 µm, where E c = 3.44 keV is the critical excitation energy 37 . Measured compositions were compared with expected phases from literature equilibrium diagrams for the ternary systems Cu-Mg-Si 38 and Cu-Mg-Sn 39 , as well as the binary Ni-Si 40 .…”
Section: Introductionmentioning
confidence: 99%