2002
DOI: 10.1063/1.1506205
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CuGaSe 2 solar cell cross section studied by Kelvin probe force microscopy in ultrahigh vacuum

Abstract: Kelvin probe force microscopy under ultrahigh vacuum conditions has been used to image the electronic structure of a Mo/CuGaSe2/CdS/ZnO thin film solar cell. Due to the high energy sensitivity together with a lateral resolution in the nanometer range we obtained detailed information about the various interfaces within the heterostructure. The absolute work function of the different materials was measured on a polished cross section. To obtain a flat and clean surface we optimized the sputtering process with Ar… Show more

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Cited by 106 publications
(56 citation statements)
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“…This is attributed to an MoSe 2 intermediate layer, formed during the CVD absorber growth. High-resolution transmission electron microscopy and scanning energy dispersive X-ray detection confirm the presence of an interfacial MoSe 2 layer with a [35] with permission thickness of 150 nm [38]. The Mo-MoSe 2 interface exhibits an intimate contact formed during the deposition process.…”
Section: Cross-sectional Studies On Complete Devicesmentioning
confidence: 86%
See 2 more Smart Citations
“…This is attributed to an MoSe 2 intermediate layer, formed during the CVD absorber growth. High-resolution transmission electron microscopy and scanning energy dispersive X-ray detection confirm the presence of an interfacial MoSe 2 layer with a [35] with permission thickness of 150 nm [38]. The Mo-MoSe 2 interface exhibits an intimate contact formed during the deposition process.…”
Section: Cross-sectional Studies On Complete Devicesmentioning
confidence: 86%
“…The topography and work function under dark conditions of the Ga-rich CuGaSe 2 cell are shown in Fig. 10.9a and b, respectively [35]. Figure 10.9c shows the work function image under illumination.…”
Section: Cross-sectional Studies On Complete Devicesmentioning
confidence: 98%
See 1 more Smart Citation
“…Overall, while EFM and KPFM were successfully applied for studies of solar materials, [98][99][100] and semiconductor and electroceramic devices, [ 88 ] only few applications to energy materials are available. Future potential-once the systems with controlled environment become accessible, and when these measurements can be implemented in liquids, either with different signal generation mechanisms or with the insulated probes.…”
Section: Potential Sensitive Spmmentioning
confidence: 99%
“…Kelvin probe force microscopy (KPFM) technique adopts a non-contact tip with a conductive coating to measure the potential difference between the tip and the adjacent surface Glatzel et al 2002;Hoppe et al 2005;Palermo et al 2007;Wu et al 2010Wu et al , 2013. The surface potential relates to and has an effect on a number of different surface phenomena, including those of catalytic activity, doping/impurities/defects, band-bending at interfaces, polarization of surfaces, etc.…”
Section: Introductionmentioning
confidence: 99%