1957
DOI: 10.1021/ie50575a026
|View full text |Cite
|
Sign up to set email alerts
|

Curing Process in Phenolic Resins X-Ray Diffraction Analysis

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

1
1
0

Year Published

1959
1959
2016
2016

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 11 publications
(2 citation statements)
references
References 0 publications
1
1
0
Order By: Relevance
“…XRD graph of sepiolite modified resol resins were given Figure . The values of PFR and sepiolite are compatible with the results of the literature . The diffraction patterns of the resols pre‐Þred at temperatures below 500 °C show a single halo at about 20°, being essentially similar to that of unÞred sample …”
Section: Resultssupporting
confidence: 90%
“…XRD graph of sepiolite modified resol resins were given Figure . The values of PFR and sepiolite are compatible with the results of the literature . The diffraction patterns of the resols pre‐Þred at temperatures below 500 °C show a single halo at about 20°, being essentially similar to that of unÞred sample …”
Section: Resultssupporting
confidence: 90%
“…( P A P E ) g e I = 0.333 (2) Thus nonstoichiometric compositions should not reach the gel point provided the ratio of amine hydrogens to epoxide groups ( r ) is less than l/3 for excess diepoxide or l/r is less than 1/3 for excess diamine. Bearing this in mind several polymers with compositions within these limits were prepared from DDM and DGEBA and their Mn's measured.…”
Section: ( P a P E ) G E L = I / ( F El ) ( F A -1 )mentioning
confidence: 99%