2012
DOI: 10.5560/zna.2012-0062
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Current Conduction in Poly(3-Hexylthiophene) and in Poly(3- Hexylthiophene) doped [6,6]-Phenyl C61-Butyric Acid Methylester Composite Thin Film Devices

Abstract: Transport properties of poly(3-hexylthiophene) (P3HT), and of its blend with [6,6]-phenyl C61-butyric acid methylester (PCBM), were studied by analysing temperature dependent current-voltage characteristics of spin cast thin films sandwiched between aluminium electrodes in a metal-insulatormetal (MIM) configuration. It was found that in Al/P3HT/Al devices, the current is limited by space charge that accumulates near the hole injecting electrode due to the poor bulk transport properties of P3HT. At low temperat… Show more

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Cited by 18 publications
(8 citation statements)
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“…This TE current may be represented as the sum of Ohmic current and trap-free SCLC, i.e., I TE = I Ohm + I TF‑SCLC . Further, under these circumstances, both TE and FN carrier injection/extraction mechanisms are expected so the total current response can be expressed as I = I TE + I FN . Also, the TE current is expected to manifest as a curve of positive slope in a FN plot, and consistent with this, such a behavior was apparent in the low and intermediate bias regions in the FN plot (see Figure i).…”
Section: Resultsmentioning
confidence: 65%
“…This TE current may be represented as the sum of Ohmic current and trap-free SCLC, i.e., I TE = I Ohm + I TF‑SCLC . Further, under these circumstances, both TE and FN carrier injection/extraction mechanisms are expected so the total current response can be expressed as I = I TE + I FN . Also, the TE current is expected to manifest as a curve of positive slope in a FN plot, and consistent with this, such a behavior was apparent in the low and intermediate bias regions in the FN plot (see Figure i).…”
Section: Resultsmentioning
confidence: 65%
“…The larger resistance process related to the dependence of the interface-depleted region resistance (R d ) on the applied DC voltage can be shown by the slope (− m ) in the log(R d ) vs. log(V DC ) plots. The m values showed m ~1.2, 1.1 and 0.8 values for ×30, ×50 and ×70, respectively, indicating that the charge carriers exhibit a near ohmic behavior typical of semiconductor material where carriers are generated thermally by the promotion of electrons from the valence band to the conduction band [ 54 ]. In our case, the promotion of carriers can be also favored by the presence of donor–acceptor interactions in P3HT:TiO 2 nanocomposites, as we will discuss later in the manuscript.…”
Section: Resultsmentioning
confidence: 99%
“…This process removes the charges from the space charge region, which enable the further injection of carriers from the electrode, leading to the increase in the carrier density, which results in the rapid change in current with applied voltage. Thus, the current is directed by the trap controlled space charge limited conduction (TCLC) process [12].…”
Section: Resultsmentioning
confidence: 99%