Current-dependent hot-electron stresses on InGaP-gated and AlGaAs-gated low noise PHEMTs

Huang, Haiyang; Chang, Cieh Pin; Houng, Mau Phon; Wang, Yeong-Her

doi:10.1016/j.microrel.2006.02.014

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2016

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“…In general, with respect to the application scenario, different test methods are used. The high gate-drain voltage stress used for large signal test is provided to evaluate hot electron effect [10][11][12]. The test of hydrogen effects which caused the degradation of maximum drain current and surface corrosion is introduced in [13][14][15].…”

Section: Introductionmentioning

confidence: 99%

The Design and Life Test of a Multifunction Power Amplifier for Space Application

Shang

Wang

et al. 2016

Active and Passive Electronic Components

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A new multifunction power amplifier (MFPA) is designed and fabricated for the application of point-to-point K-Band backhaul TR module. A DC temperature life test was performed to model the up-limit temperature effect of the designed MFPA under space application. After 240 hours of 100°C life test, the test results illustrate that the designed MFPA has only slight power degradation at the saturation region without change of the linear gain. The general performance of the designed MFPA satisfies the requirement of the application scenario.

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