2023 IEEE International Integrated Reliability Workshop (IIRW) 2023
DOI: 10.1109/iirw59383.2023.10477634
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Current Driven Modeling and SILC Investigation of Oxide Breakdown under Off-state TDDB in 28nm dedicated to RF applications

Tidjani Garba-Seybou,
Alain Bravaix,
Xavier Federspiel
et al.
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