2010
DOI: 10.1021/nn100223j
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Current Imaging and Electromigration-Induced Splitting of GaN Nanowires As Revealed by Conductive Atomic Force Microscopy

Abstract: Current images of electromigration-induced common vapor-liquid-solid-grown GaN nanowires were obtained using a conductive atomic force microscope. Structural characterization indicated that these wurtzite (ZW) [0110] nanowires contained longitudinal zinc blende (ZB) defects as stacking faults. The current was attributed to tunneling current through the Schottky barrier between the AFM tip and a nanowire, which was dominated by the local nanowire surface work function. Due to the electromigration induced by lar… Show more

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Cited by 27 publications
(21 citation statements)
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“…For example, conductive atomic force microscopy (CAFM) enables us to investigate the conductive properties of individual quantum structures [19-21], while scanning Kelvin microscopy (SKM) [22] and scanning capacitance microscopy (SCM) [23] are valuable tools for measuring the surface potential and carrier density distributions of individual quantum structures. These techniques have already been performed to study the electrical properties of individual quantum dots [24-31], but the electrical property studies on individual QRs are still lacking.…”
Section: Introductionmentioning
confidence: 99%
“…For example, conductive atomic force microscopy (CAFM) enables us to investigate the conductive properties of individual quantum structures [19-21], while scanning Kelvin microscopy (SKM) [22] and scanning capacitance microscopy (SCM) [23] are valuable tools for measuring the surface potential and carrier density distributions of individual quantum structures. These techniques have already been performed to study the electrical properties of individual quantum dots [24-31], but the electrical property studies on individual QRs are still lacking.…”
Section: Introductionmentioning
confidence: 99%
“…In the literature, Liu et al . investigated the char residue of wood plastics composites . The presence of Cu 2+ can catalyze the dehydrogenation carbonization reaction of wood powder.…”
Section: Resultsmentioning
confidence: 99%
“…Additionally, ITO, together with its substitutes, fluorine-doped tin oxide (FTO) and aluminum zinc oxide (AZO) are brittle and thus unsuitable for future applications in flexible and stretchable electronic devices [100]. Metallic electrodes have been reported to exhibit a high atomic mobility and some of them also have a low chemical stability, which may result in destruction of the molecular junction upon oxidation or electromigration [101][102][103][104][105][106]. In addition, for certain fields of applications such as molecular optoelectronics, metallic electrodes may quench the excited states of the molecules and metal electrodes may limit optical access to the organic materials [107], generate light-induced plasmonic effects [108] or significant electrode expansion under visible light [109] masking the molecular optoelectronic properties.…”
Section: Self-assembled Monolayers Onto Semiconductors or Non-metallimentioning
confidence: 99%