Current-mode Temperature Compensation for a Differential Logarithmic Amplifier in 180nm BiCMOS

Wenger, Y.; Meinerzhagen, B.; Ghazinour, A.

doi:10.1109/icecs.2018.8617846

Cited by 4 publications

(4 citation statements)

References 8 publications

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“…By offsetting the bias points between main and reference path, the temperature error is minimized. Another purely analog approach to temperature compensation, in this case for SiGe square-law detectors, is proposed in [89]. It is based on a translinear current divider and a current reference.…”

Section: Power Calibration Against Temperaturementioning

confidence: 99%

Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?

Wenger,

Meinerzhagen,

Issakov

2024

IEEE Access

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With automotive radar and 5G/6G communications, mass-market applications for millimeterwave circuits in silicon technologies have been identified or established in recent years. For high-volume, millimeter-wave integrated circuits, operating roughly between 30 GHz and 300 GHz, testability is a major concern, both from an overall cost as well as a quality assurance perspective. A solution for cost effective, low-overhead test of millimeter-wave integrated circuits is the integration of built-in self-test (BIST) features into the high-frequency front-end. Because BIST is an emerging topic in high-frequency circuit design, the field is still very fragmented. A plethora of different system concepts as well as building blocks have been proposed in recent years. This paper tries to provide a comprehensive overview of the state of the art in millimeter-wave BIST in an attempt to drive the field towards identification of standardized self-test solutions.INDEX TERMS Built-in self-test, CMOS, millimeter-wave transceivers, SiGe, silicon.

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Section: Power Calibration Against Temperaturementioning

confidence: 99%

Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?

Wenger,

Meinerzhagen,

Issakov

2024

IEEE Access

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“…The error is the lowest when the detector is deep into its peak range. Clearly, the temperature errors of square-law detectors are so large that temperature compensation [28], [49], [50] is required to keep the accuracy specifications discussed in Section II-C.…”

Section: Temperature and Process Variationmentioning

confidence: 99%

“…Compared to the process variation, which is largely within ±1 dB, as reported above, the temperature dependence has to be considered the main source of error, especially for square-law detectors. As already stated in Section IV, either analog [46], [49] or digital [20], [28] temperature compensation has to be used to achieve sufficient accuracy over temperature in practice.…”

Section: Process and Temperature Sensitivitymentioning

confidence: 99%

Differential-Mode Power Detection for Built-In Self-Test of SiGe Automotive Radar Transceiver Front Ends

Wenger,

Ng,

Korndörfer

et al. 2024

IEEE Trans. Microwave Theory Techn.

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Recently, the feasibility of differential-mode power detection for built-in self-test (BIST) in millimeter-wave SiGe transceiver front ends has been demonstrated. In this work, a system analysis of typical BIST scenarios is performed. Specifications for the input power levels as well as the accuracy of power detectors are derived from this analysis. A need for at least two different differential detector architectures is identified. Two detectors are derived from the differential power measurement concept, analyzed, and implemented in the 76-81-GHz automotive radar frequency band. They feature a low power consumption of 500 µW and, to the authors' best knowledge, the lowest published circuit areas of approximately 0.005 mm 2 while still being input matched to the differential 100 system impedance. Both these characteristics are essential to keep the overhead of the BIST minimal. With dynamic ranges of 30 dB and up to 46 dB for the two different architectures, the differential power detector concept can achieve sufficient performance for BIST applications. The robustness against process and temperature effects as well as noise is analyzed and reported for both detectors.

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“…For example, in 2017, Javed S. Gaggatur et al from the Indian Institute of Science and Technology proposed a technique for the performance compensation of integrated CMOS power amplifiers based on non-invasive temperature sensing, which is expected to compensate for degradation due to self-heating [21]. A new method for the temperature compensation of on-chip differential logarithmic amplifiers was proposed by Y. Wenger of the Technical University of Braunschweig, Germany, and A. Ghazinour of NXP Semiconductors in 2018 [22]. The results showed that better compensation is achieved in the temperature range of −40 [23], which achieves better compensation for PA gain in the temperature range of −45 • C to +125 • C. In 2020, Fariborz Lohrabi Pour et al from Virginia Tech proposed a temperature-compensated power amplifier [24] that can operate reliably over a temperature range of −40 • C to +225 • C.…”

Section: Introductionmentioning

confidence: 99%

On-Chip Temperature Compensation for Small-Signal Gain Variation Reduction

2022

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Power amplifier (PA) specifications are closely related to changes in temperature; thus, the small-signal gain (S21) of PA decreases with the temperature increase. To compensate for the degradation caused by the decrease in S21, we present a compensation circuit that consists of two diodes and four resistors. At the same time, a differential stacked millimeter-wave wideband PA was designed and implemented based on this compensation circuit and 55 nm CMOS process. The post-layout simulation results showed that the fluctuation of S21 reduced from 2.4 dB to 0.1 dB in the frequency range of 25−40 GHz over the temperature range of −40 °C to 125 °C. Furthermore, the proposed on-chip temperature compensation circuit also applies to multi-stage cascaded microwave/mm-wave power amplifiers.

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Current-mode Temperature Compensation for a Differential Logarithmic Amplifier in 180nm BiCMOS

Cited by 4 publications

References 8 publications

Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?

Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?

Differential-Mode Power Detection for Built-In Self-Test of SiGe Automotive Radar Transceiver Front Ends

On-Chip Temperature Compensation for Small-Signal Gain Variation Reduction

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