1973
DOI: 10.1016/0029-554x(73)90799-4
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Current state of the art in semiconductor detectors

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Cited by 9 publications
(5 citation statements)
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“…To obtain this, the readout electronics must be low noise. Historically, the front-end transistor was a JFET cooled to the temperature of the detector (77 K, liquid nitrogen temperature) [9,23]. This reduced the energy resolution to less than 1 keV for 1 MeV photons.…”
Section: Technology Material Geometry and Performance Of Hpge Gammmentioning
confidence: 99%
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“…To obtain this, the readout electronics must be low noise. Historically, the front-end transistor was a JFET cooled to the temperature of the detector (77 K, liquid nitrogen temperature) [9,23]. This reduced the energy resolution to less than 1 keV for 1 MeV photons.…”
Section: Technology Material Geometry and Performance Of Hpge Gammmentioning
confidence: 99%
“…This has become possible when defect and impurity control in the process of crystal growth has reached a sufficient level of reliability. In addition to point defects and impurities, dislocations play a major role as they behave like a sink for impurities [1,9,12]. They can currently be revealed by chemical crystal etching.…”
Section: Starting Materialsmentioning
confidence: 99%
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