2009
DOI: 10.1007/s00706-009-0149-z
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Current versus gate voltage hysteresis in organic field effect transistors

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Cited by 291 publications
(256 citation statements)
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References 166 publications
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“…[56][57][58] The orientation of the hysteresis is significant and suggests a charge injection effect. 59,60 By comparing the extracted forward (v f D ) and reverse (v r D ) sweep Dirac points a similar trend appears in both materials. Generally, v f D is constant, while v r D increases suggesting that charge injection occurs only when ϵ f > 0.…”
Section: Discussionsupporting
confidence: 55%
“…[56][57][58] The orientation of the hysteresis is significant and suggests a charge injection effect. 59,60 By comparing the extracted forward (v f D ) and reverse (v r D ) sweep Dirac points a similar trend appears in both materials. Generally, v f D is constant, while v r D increases suggesting that charge injection occurs only when ϵ f > 0.…”
Section: Discussionsupporting
confidence: 55%
“…The electronic performances of the bare P3HT-OFET degrade upon the direct exposure to the lithium perchlorate aqueous solution. This system shows a progressive current increase as the sweeping rate decreases, as well as a larger hysteresis area, which can be attributed to the penetration of perchlorate anions into the OS combined with other mechanisms [27]. Further investigation would be needed to determine the contribution of each phenomenon to the overall OFET hysteresis, which is outside the scope of this paper.…”
Section: Resultsmentioning
confidence: 96%
“…16,17 In contrast, the TOMDs already possess their own transistors for active driving, so they are considered one of the simplest and most cost-effective memory devices for flexible plastic memory modules in the coming flexible electronics era. 18,19 It has been reported that TOMDs have memory functions from ferroelectric polymers, metal nanoparticles or charge trapping layers, and polymer energy well structures. [20][21][22][23][24][25][26][27][28][29][30] However, most TOMDs reported to date have limitations with respect to high operation voltages and/or poor retention (stability) characteristics, even though basic memory functions in transistor structures can be welldemonstrated.…”
Section: Introductionmentioning
confidence: 99%