2013
DOI: 10.1080/00207217.2012.720946
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Current–voltage characteristics of Schottky diode simulated using semiconductor device equations

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Cited by 36 publications
(12 citation statements)
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“…This value is in very close agreement with the theoretical value of 8.16 A (cm K) −2 for n-type GaAs. Thus, it can be said that the I-V characteristics of the device obey the TE current model in the 120-300 K range [34][35][36][37][38][39][40][41].…”
Section: Resultsmentioning
confidence: 99%
“…This value is in very close agreement with the theoretical value of 8.16 A (cm K) −2 for n-type GaAs. Thus, it can be said that the I-V characteristics of the device obey the TE current model in the 120-300 K range [34][35][36][37][38][39][40][41].…”
Section: Resultsmentioning
confidence: 99%
“…The value of ideality factor and barrier height determined from the forward bias I-V characteristics for dark and 100 mW/cm 2 is given in Table 1. The obtained ideality factor value is higher than unity due to series resistance, inhomogeneities of barrier height and interface states [40][41][42][43][44][45]. In addition, the series resistance affects the linear region of forward bias I-V curves and in turn, the linear region deviates from linearity.…”
Section: Photocurrent-voltage (I-v) Characteristics Of the Diodementioning
confidence: 89%
“…Internal Electric Field Characterization. The current through the Schottky diode formed by MAPbX 3 (X = Cl, Br, or I) and LSMO, I diode , is analyzed in the frame of the thermionic emission diffusion equation (36)…”
Section: La 07 Sr 03 Mno 3 /Ch 3 Nh 3 Pbimentioning
confidence: 99%