2022
DOI: 10.1016/j.diamond.2022.108975
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CVD diamond-SiC composite films: Structure and electrical properties

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Cited by 12 publications
(7 citation statements)
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“…For comparison reasons, 500 nm-thick diamond-SiC composite lms were synthesized using similar growth conditions as for the diamond-Ge composite, but instead of germane, a monosilane (SiH 4 ) gas was added into the gas mixture with concentration [SiH 4 ]/[CH 4 ] = 20%. 61,67 Other CVD process parameters for growth of the diamond-SiC composite were: concentration of methane 4%, total gas ow 500 sccm, microwave power 5 kW, pressure 72 Torr, substrate temperature 800 °C, deposition time 2 hours, and growth rate z 250 nm h −1 . More details on such growth and the exact recipe are reported in ref.…”
Section: Methodsmentioning
confidence: 99%
“…For comparison reasons, 500 nm-thick diamond-SiC composite lms were synthesized using similar growth conditions as for the diamond-Ge composite, but instead of germane, a monosilane (SiH 4 ) gas was added into the gas mixture with concentration [SiH 4 ]/[CH 4 ] = 20%. 61,67 Other CVD process parameters for growth of the diamond-SiC composite were: concentration of methane 4%, total gas ow 500 sccm, microwave power 5 kW, pressure 72 Torr, substrate temperature 800 °C, deposition time 2 hours, and growth rate z 250 nm h −1 . More details on such growth and the exact recipe are reported in ref.…”
Section: Methodsmentioning
confidence: 99%
“…57 4. Hexagonal 4H-SiC: Few reports have been published recently on CVD of hexagonal (4H-SiC) polytype thin films, 36,37,40,51,57,58 a fact which could be attributed to their already well-established properties and widespread use in a variety of proven technological applications, as discussed above. The primary focus of ongoing research efforts into CVD 4H-SiC thin films is on enhancing epitaxy and reducing defects in well-established 4°off-axis 4H-SiC substrates.…”
Section: Ecsmentioning
confidence: 99%
“…• L. Zhao et al 36 gaseous species which then diffused to the substrate surface through the stagnant boundary layer above the wafer to react and form the 4H-SiC phase. However, a growth rate of ∼50 μm h −1 was reported at ∼15 torr, decreasing to less than ∼5 μm h −1 at ∼120 torr.…”
Section: Ecsmentioning
confidence: 99%
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