1991
DOI: 10.1016/0956-7151(91)90184-3
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Cyclic fatigue-crack propagation along ceramic/metal interfaces

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Cited by 86 publications
(34 citation statements)
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“…Considering a metal-ceramic interface has several advantages over the homogeneous material case: (i) crack growth along interfaces occurs when the interfacial cohesive strength is lower than that of the surrounding homogeneous materials; with decreasing cohesive strength the plastic zone size decreases, which reduces the computational time and decreasing cohesive strength increases the effective cohesive length, which improves numerical accuracy for a given mesh resolution [25]; (ii) along a bimaterial interface, crack growth often occurs along the interface so that our assumption of straight-ahead crack growth is appropriate; and (iii) even though straight-ahead crack growth occurs, the mismatch in material properties allows mixed-mode loading effects to be explored. In addition, fatigue crack growth along metal-ceramic interfaces is of interest in its own right, see [20][21][22]26]. …”
Section: Introductionmentioning
confidence: 99%
“…Considering a metal-ceramic interface has several advantages over the homogeneous material case: (i) crack growth along interfaces occurs when the interfacial cohesive strength is lower than that of the surrounding homogeneous materials; with decreasing cohesive strength the plastic zone size decreases, which reduces the computational time and decreasing cohesive strength increases the effective cohesive length, which improves numerical accuracy for a given mesh resolution [25]; (ii) along a bimaterial interface, crack growth often occurs along the interface so that our assumption of straight-ahead crack growth is appropriate; and (iii) even though straight-ahead crack growth occurs, the mismatch in material properties allows mixed-mode loading effects to be explored. In addition, fatigue crack growth along metal-ceramic interfaces is of interest in its own right, see [20][21][22]26]. …”
Section: Introductionmentioning
confidence: 99%
“…Albeit a rare event, such findings are uncommon in regular 4-point bend delamination test (Ma, 1997 Reimanis et al, 1990Reimanis et al, , 1991Ritchie et al, 1993;Phillipps et al, 1993;Ma et al, 1995Ma et al, , 1997Klingbeil and Beuth, 1997;Dauskardt, et al, 1998;Lane, et al, 2000aLane, et al, , 2000bHasegawa, et al, 2003;Hughey, et al, 2004;Shaviv, et al, 2005), corresponding investigations and experimental results on subcritical crack growth properties are extremely limited (Oh et al, 1988;Cannon et al, 1991;Shaw et al, 1994;McNaney et al, 1996;Hasegawa and Kagawa, 2006;Hirakata, et al, 2006). In this chapter, the dependence of FCG on metal layer thickness in a multi-layer thin film stack is studied.…”
Section: Discussionmentioning
confidence: 99%
“…For example, Suresh (1983Suresh ( , 1985 indicated that methods by which the path of a crack can be periodically deflected from its nominal growth plane offered one possible way of enhancing the fatigue crack growth resistance. Cannon et al, (1991) Figure 10.1 shows SEM micrographs of a MEMS relevant sample with multilayer thin film structure. The multi-layer structure was manufactured by using the standard integrated circuit fabrication processes.…”
Section: Discussionmentioning
confidence: 99%
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“…In order to design reliable engineering systems using such bimaterial interfaces, the structural integrity of the interface must be maintained over the lifetime of the component. While much research has been conducted on the strength and fast fracture behavior of oxide/metal interfaces [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15], previous work is limited to only a handful of studies that focused on time dependent crack growth at and near interfaces, specifically, fatigue crack growth under cyclic loading [16][17][18][19] and moisture-assisted crack growth under static loading [20][21][22][23]. Additionally, layered material systems are quite common, and in metal layers, plastic deformation is often constrained by the oxide when plasticity extends across the entire layer during failure.…”
Section: Introductionmentioning
confidence: 99%