Cyclic stress accelerated life test method for mechatronic products
Yashun Wang,
Jingwen Hu,
Shufeng Zhang
et al.
Abstract:The reliability requirements for mechatronics continue to increase. Traditional life test methods make it difficult to obtain the data required to assess or predict the reliability of these mechatronic products within a reasonable time. Accelerated life tests can speed up the failure process of the product by using accelerated stress conditions. And then test data is obtained to predict the reliable life of the product under normal service conditions through modeling and analysis. The test efficiency of the ac… Show more
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