“…Important to understand the measured behavior of the resistance of graphite samples is the existence of well defined interfaces between the single crystalline regions. As we mentioned in the introduction, interfaces between crystalline regions in semiconductors with different orientations for example [20,21,22,23], lead to confined quasi-two dimensional carrier systems with much larger carrier density than the bulk matrix. We assume therefore that these interfaces running parallel to the graphene layers of the graphite structure are the origin of the metallic like resistivity as well as for the apparent large carrier density measured in bulk samples, i.e.…”