DABAM: an open-source database of X-ray mirrors metrology

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Different approaches to simulate a modern X-ray beamline are considered. Several methodologies with increasing complexity are applied to discuss the relevant parameters that quantify the beamline performance. Parameters such as flux, dimensions and intensity distribution of the focused beam, and coherence properties are obtained from simple analytical calculations to sophisticated computer simulations using ray-tracing and wave optics techniques. A latest-generation X-ray nanofocusing beamline for coherent applications (ID16A at the ESRF) has been chosen to study in detail the issues related to highly demagnifying synchrotron sources and exploiting the beam coherence. The performance of the beamline is studied for two storage rings: the old ESRF-1 (emittance 4000 pm) and the new ESRF-EBS (emittance 150 pm). In addition to traditional results in terms of flux and beam sizes, an innovative study on the partial coherence properties based on the propagation of coherent modes is presented. The different algorithms and methodologies are implemented in the software suite OASYS. These are discussed with emphasis placed upon the their benefits and limitations of each.

Section: Ray-tracing Calculationsmentioning

confidence: 99%

A hierarchical approach for modeling X-ray beamlines: application to a coherent beamline

Río¹,

Celestre²,

Glass³

et al. 2019

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“…The ray-tracing engine chosen for our simulations is SHADOW3 (Sanchez del Rio et al, 2011), embedded in its recently released user interface ShadowOui (Rebuffi & Sanchez del Rio, 2016). ShadowOui can selectively analyse the instrumental profile, studying the isolated effect of individual contributions (such as photon beam, or optical elements properties), and identify the most critical features affecting the final IPF.…”

Section: Integration In the Ray-tracing Environmentmentioning

confidence: 99%

“…The simulation of the MCX beamline within the Shadow-Oui (Rebuffi & Sanchez del Rio, 2016) environment started with a careful optimization of the optical setup, in order to reproduce the experimental conditions as closely as possible:…”

Section: Comparison Between Simulated and Measured Ipf Of Existing Bementioning

confidence: 99%

“…(ii) Both mirrors include a height error profile: the first mirror is affected by the measured profile, available from the DABAM metrology database (Sanchez del Rio et al, 2016), that can be retrieved and manipulated by the DABAM widget in ShadowOui; the second mirror uses a simulated height error profile with an average slope error equal to the measured one ($ 1.0 mrad).…”

Section: Comparison Between Simulated and Measured Ipf Of Existing Bementioning

confidence: 99%

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Understanding the instrumental profile of synchrotron radiation X-ray powder diffraction beamlines

Rebuffi

Río

Busetto

et al. 2017

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A Monte Carlo algorithm has been developed to calculate the instrumental profile function of a powder diffraction synchrotron beamline. Realistic models of all optical elements are implemented in a ray-tracing software. The proposed approach and the emerging paradigm have been investigated and verified for several existing X-ray powder diffraction beamlines. The results, which can be extended to further facilities, show a new and general way of assessing the contribution of instrumental broadening to synchrotron radiation data, based on ab initio simulations.

“…With exception of the work of Roth et al (2014), investigating the inner structure of X-ray lenses, the present models consider only lens shape and departure from a perfect parabolic shape to either test the limits of figure errors and fabrication defects, or to improve lens shape and focusing quality. These, however, do not include the data from real lenses metrology, as is routinely done for X-ray mirrors simulations (Sanchez del Rio et al, 2016). Furthermore, it is important to have simulation tools to allow for the accurate implementation of synchrotron or XFEL light sources, allowing the CRL to be included in a complete beamline configuration in combination with other optical elements.…”

Section: Introductionmentioning

confidence: 99%

Modelling phase imperfections in compound refractive lenses

Celestre

Berujon

Roth

et al. 2020

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A framework based on physical optics for simulating the effect of imperfect compound refractive lenses (CRLs) upon an X‐ray beam is described, taking into account measured phase errors obtained from at‐wavelength metrology. A CRL stack is modelled, with increasing complexity, as a single thin phase element, then as a more realistic compound element including absorption and thickness effects, and finally adding realistic optical imperfections to the CRL. Coherent and partially coherent simulations using Synchrotron Radiation Workshop (SRW) are used to evaluate the different models, the effects of the phase errors and to check the validity of the design equations and suitability of the figures of merit.