2020
DOI: 10.1016/j.infrared.2020.103389
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Dark current and 1/f noise characteristics of In0.74Ga0.26As photodiode passivated by SiNx/Al2O3 bilayer

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Cited by 9 publications
(2 citation statements)
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“…Regarding photodiode type PD, 1/f noise is negligible without bias, explaining the observation in Figure 5d; 1/f noise exists with bias, and surface passivation like atomic layer deposition (ALD) Al 2 O 3 passivation can effectively reduce it. [31] As seen from Figure 5a-c, the dual interface passivated photodiode can detect broadband light at wavelengths from 300 to 770 nm, which corresponds to the 2D perovskite absorption spectrum range, and its peak EQE, R, and D* reach 90%, 0.39 A W −1 and 5.5 × 10 12 Jones, respectively. Photocurrents of the dual interface passivated photodiode at different light intensites of 532 nm laser measured without bias are presented in Figure 6a.…”
Section: Resultsmentioning
confidence: 93%
“…Regarding photodiode type PD, 1/f noise is negligible without bias, explaining the observation in Figure 5d; 1/f noise exists with bias, and surface passivation like atomic layer deposition (ALD) Al 2 O 3 passivation can effectively reduce it. [31] As seen from Figure 5a-c, the dual interface passivated photodiode can detect broadband light at wavelengths from 300 to 770 nm, which corresponds to the 2D perovskite absorption spectrum range, and its peak EQE, R, and D* reach 90%, 0.39 A W −1 and 5.5 × 10 12 Jones, respectively. Photocurrents of the dual interface passivated photodiode at different light intensites of 532 nm laser measured without bias are presented in Figure 6a.…”
Section: Resultsmentioning
confidence: 93%
“…In general, the 1/f noise is considered as the major influence of device performance, although many studies have been done before [3][4][5][6][7][8][9], it still has no precise or general physical model to perform in infrared device noise analysis. Baile Chen et al studied the origin of 1/f noise in Hg1-xCdxTe detectors and founded that the 1/f noise mainly comes from diffusion current (Idiff), generationrecombination current (Igr), and shunt current (Ishunt) [10].…”
Section: Introductionmentioning
confidence: 99%