2003
DOI: 10.1109/ted.2002.806963
|View full text |Cite
|
Sign up to set email alerts
|

Dark current reduction in stacked-type CMOS-APS for charged particle imaging

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
20
0

Year Published

2006
2006
2019
2019

Publication Types

Select...
6
1

Relationship

1
6

Authors

Journals

citations
Cited by 27 publications
(20 citation statements)
references
References 9 publications
0
20
0
Order By: Relevance
“…A normal incident electron gun was utilized for charge compensation. Stigmatic images of negative secondary ions from each analysis field were acquired in the sequence 12 -isotopographs was stopped when the image was clearly observed using the nondestructive monitoring mode, which is a significant characteristic of the SCAPS detector (Takayanagi et al, 2003).…”
Section: Isotope Ratio Imaging (Isotopography) For Hydrogen and Nitrogenmentioning
confidence: 99%
“…A normal incident electron gun was utilized for charge compensation. Stigmatic images of negative secondary ions from each analysis field were acquired in the sequence 12 -isotopographs was stopped when the image was clearly observed using the nondestructive monitoring mode, which is a significant characteristic of the SCAPS detector (Takayanagi et al, 2003).…”
Section: Isotope Ratio Imaging (Isotopography) For Hydrogen and Nitrogenmentioning
confidence: 99%
“…Dark current is temperature-sensitive and typically normalised by area. Photobit Technology Corporation and Tokyo institute of Technology reported a low dark current stacked CMOS APS for charged particle detection [124,125]. A use of a p-MOSFET transistor for readout reduces the hot carrier effect; thereby the dark current within the low temperature region is greatly decreased.…”
Section: Low Noise Sensorsmentioning
confidence: 99%
“…guidance and navigation (e.g., stereovision [129]), video phones, computer inputs, for charged particle imaging [124,125] such as ion and electron imaging, IR-vision applications, low light level applications [16][17][18], electrostatic sensing, instrumentation, imaging phones, astronomy and low-end professional cameras.…”
Section: Other Applicationsmentioning
confidence: 99%
“…In order to satisfy these conditions, a Stacked CMOS-type Active Pixel Sensor (SCAPS) has been proposed [1]. The SCAPS has high advantages over conventional systems including twodimensional detection, wide dynamic range, no insensitive period, direct detection of charged particles, a high degree of robustness, and high fill factor [2]. High precision isotope ratio imaging of microscale under high mass resolution (isotopography) has been realized by the combination of a stigmatic secondary ion mass spectrometry (SIMS) instruments (e.g., Cameca ims-1270) and SCAPS [1].…”
Section: Introductionmentioning
confidence: 99%