2001
DOI: 10.1016/s0039-6028(01)01367-x
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Darwin's theory for the grazing incidence geometry

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Cited by 12 publications
(4 citation statements)
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“…These are the reasons why this method found limited application; namely, in the symmetric geometry, one can combine a standard two-beam approach for the neighbourhood of a diffraction maximum with a kinematical formula for the parts of a CTR that are further away from the diffraction maximum. In a series of papers by Takahashi and coworkers (Takahashi & Nakatani, 1995;Yashiro et al, 2001;Yashiro et al, 2004), the Darwin method was generalized to an asymmetric diffraction geometry and to a three-beam diffraction case; however, the method is still based on kinematical reflection coefficients of a single subatomic layer. In the present paper, we follow the general concept of Caticha (1994), but we improve it in the following aspects.…”
Section: Introductionmentioning
confidence: 99%
“…These are the reasons why this method found limited application; namely, in the symmetric geometry, one can combine a standard two-beam approach for the neighbourhood of a diffraction maximum with a kinematical formula for the parts of a CTR that are further away from the diffraction maximum. In a series of papers by Takahashi and coworkers (Takahashi & Nakatani, 1995;Yashiro et al, 2001;Yashiro et al, 2004), the Darwin method was generalized to an asymmetric diffraction geometry and to a three-beam diffraction case; however, the method is still based on kinematical reflection coefficients of a single subatomic layer. In the present paper, we follow the general concept of Caticha (1994), but we improve it in the following aspects.…”
Section: Introductionmentioning
confidence: 99%
“…By considering the general formula of the scattering amplitude from an atomic plane 24) and multiple scattering within the same atomic plane, 25) Eqs. ( 6) and ( 7) can be applied to the entire reciprocal space.…”
Section: Kinematical Expressionmentioning
confidence: 99%
“…Yashiro et al [15] In this work, a Si(001) surface was assumed to be the substrate. For structural analysis, the Si 113 reflection of the substrate was selected.…”
Section: Calculationmentioning
confidence: 99%