Data analysis methods in time correlation mean lifetime measurements

Dumont, A. M.; Camhy-Val, C.

doi:10.1016/0029-554x(73)90301-7

Cited by 6 publications

(2 citation statements)

References 4 publications

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“…The pulse distribution consists of a background part at the left and the right interpreted as accidental coincidences occuring within the TAC time range, and of a decay curve composed of real retarded events plus background pulses. All the measured time spectra have been analysed by the "slope method" [4,6] where an exponential is fitted to the experimental data by a least squares procedure. In this fitting procedure the background was always kept constant.…”

Section: Methodsmentioning

confidence: 99%

Half-life of the 6.21 keV level in181Ta

1981

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The half-life of the first excited state at 6.21 keV in ~81Ta has been measured using the delayed coincidence technique. Si(Li) detectors of high energy resolution and a time-toamplitude converter were used in these experiments. Great care was taken to reduce and determine the rate of accidental events. The final result for the half-life from 18 measurements was found to be T1/z=(6.05_0.12)gs. This value is significantly lower than previously published ones. Possible reasons for this discrepancy are discussed.

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Section: Methodsmentioning

confidence: 99%

Half-life of the 6.21 keV level in181Ta

1981

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“…All the measured time spectra have been analysed by the "slope method" [45,46] where an exponential is fitted to the experimental data by a least square procedure. In this fitting procedure the background is treated as a parameter and was always kept constant.…”

Section: Data Treatmentmentioning

confidence: 99%

Half lives of the 482.2 keV and 615.3 keV levels in181Ta

Mouchel

Hansen

1984

Z Physik A

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The half lives of the excited levels at 482.2keV and 615.3keV in 181Ta have been measured by the delayed coincidence technique. In the nanosecond time range (482.2 keV level) the most serious sources of errors are jitter, walk and drift phenomena. To minimize those the time pick-off has been defined carefully by means of modern fast timing detectors and electronics. In the microsecond time range (615.3 keV level) the ratio of true delayed coincidences to chance coincidences influences considerably the final accuracy of the half-life measurements. It has been reduced as much as possible.From a series of independent measurements half lives of T1/2=(10.67 _+0.05)ns and T1/2 =(17.64_+0.14)ps have been deduced for the 482.2keV and 615.3keV levels, respectively. The results have been compared with other values published before.

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