Data-Based Approach for Final Product Quality Inspection: Application to a Semiconductor Industry

Al-Kharaz, Mohammed; Ananou, Bouchra; Ouladsine, Mustapha; Combal, Michel; Pinaton, Jacques

doi:10.1109/cdc45484.2021.9683231

2021 60th IEEE Conference on Decision and Control (CDC) 2021

DOI: 10.1109/cdc45484.2021.9683231

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Data-Based Approach for Final Product Quality Inspection: Application to a Semiconductor Industry

Mohammed Al-Kharaz

Bouchra Ananou

Mustapha Ouladsine

et al.

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Challenges for Predictive Quality in Multi-stage Manufacturing: Insights from Literature Review

Bretones Cassoli,

Metternich

2023

Proceedings of the 3rd International Workshop on Software Engineering and AI for Data Quality in Cyber-Physical Systems/Interne

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Challenges for Predictive Quality in Multi-stage Manufacturing: Insights from Literature Review

Bretones Cassoli,

Metternich

2023

Proceedings of the 3rd International Workshop on Software Engineering and AI for Data Quality in Cyber-Physical Systems/Interne

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Data-Based Approach for Final Product Quality Inspection: Application to a Semiconductor Industry

Cited by 1 publication

References 12 publications

Challenges for Predictive Quality in Multi-stage Manufacturing: Insights from Literature Review

Challenges for Predictive Quality in Multi-stage Manufacturing: Insights from Literature Review

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