BACKGROUND: Non-destructive determination of the internal quality of fruit with a thick rind and of a large size is always difficult and challenging. To investigate the feasibility of the dielectric spectroscopy technique with respect to determining the sugar content of melons during the postharvest stage, three cultivars of melon samples (160 melons for each cultivar) were used to acquire dielectric spectra over the frequency range 20-4500 MHz. The three cultivars of melons were divided separately into a calibration set and a prediction set in a ratio of 3:1 by a joint x-y distance algorithm. Partial least squares (PLS) and extreme learning machine (ELM) methods were applied to develop individual-cultivar and multi-cultivar models based on full frequencies (FFs) and effective dielectric frequencies (EDFs) selected by the successive projection algorithm (SPA).
RESULTS:The results showed that ELM models demonstrated a better performance than PLS models for the same input dielectric variables. Most of the models built based on the EDFs selected by SPA had a slightly worse performance compared to those based on FFs. For both PLS and ELM methods, the models for multi-cultivars demonstrated a worse calibration and prediction performance compared to those for individual cultivars. When individual-cultivar and multi-cultivar samples were used to build sugar content determination models, the best model was FFs-ELM (R p = 0.887, RMSEP = 0.986), FFs-ELM (R p = 0.870, RMSEP = 1.028), FFs-PLS (R p = 0.882, RMSEP = 1.010) and FFs-ELM (R p = 0.849, RMSEP = 1.085) for 'Hongyanliang', 'Xinzaomi', 'Manao' and multi-cultivar melons, respectively. CONCLUSION: The present study indicates that it is possible to develop both individual-cultivar and multi-cultivar models for determining the sugar content of melons based on the dielectric spectroscopy technique.