2002
DOI: 10.1109/lpt.2002.1021974
|View full text |Cite
|
Sign up to set email alerts
|

DC drift activation energy of LiNbO3 optical modulators based on thousands of hours of active accelerated aging tests

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
2
0

Year Published

2003
2003
2021
2021

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 12 publications
(4 citation statements)
references
References 7 publications
1
2
0
Order By: Relevance
“…As shown by Minford [9], the temperature plays an important role in the drift behavior in z-cut titanium-diffused waveguide devices, since the different drift rates decrease when the temperature of the modulator increases. These results are confirmed by the fact that the temperature dependence of the drift rate in x-cut or z-cut LN MZ modulators follows Arrhenius distribution [10], [11]. The silica buffer layer has also a large influence on the drift.…”
Section: Different Sources Of Drift In Ln Mz Modulators and Their Relative Magnitudessupporting
confidence: 57%
See 1 more Smart Citation
“…As shown by Minford [9], the temperature plays an important role in the drift behavior in z-cut titanium-diffused waveguide devices, since the different drift rates decrease when the temperature of the modulator increases. These results are confirmed by the fact that the temperature dependence of the drift rate in x-cut or z-cut LN MZ modulators follows Arrhenius distribution [10], [11]. The silica buffer layer has also a large influence on the drift.…”
Section: Different Sources Of Drift In Ln Mz Modulators and Their Relative Magnitudessupporting
confidence: 57%
“…and are the conductivities variations over the waveguide. Thus, (8) becomes (9) If we assume that (10) where and are the dimensions of the waveguide along Xand Z-axes, respectively, then (9) becomes (11) where and are the relative conductivity gradients along X-and Z-axes, respectively. They have been evidenced by our group, by means of a polaron microphotoluminescence technique [22].…”
Section: B Experimental Approachmentioning
confidence: 99%
“…Reported E a varies between 1.0 eV and 1.4 eV for unbuffered X-cut LiNbO 3 [21,22]. This range of activation energies means a broad range of acceleration factors.…”
Section: −Eamentioning
confidence: 99%
“…The obtained comparative results Ea1/Ea2 = 1.8, where Ea1 -activation energy of a modulator after treatment LiNbO3 and Ea2 -activation energy of a references modulator enables us to draw a firm conclusion that LiNbO3-based EO-modulators can operate longer with a smaller number of errors at the defined driver parameters after treatment near-surface structure. Reported Ea varies between 1.0 eV and 1.4 eV for unbuffered X-cut LiNbO3 [21,22]. This range of activation energies means a broad range of acceleration factors.…”
Section: Temperature Stability Of Eo-modulators (Long-term Dc-drift)mentioning
confidence: 99%