De-embedding techniques for transmission lines: An exploration, review, and proposal

Erickson, Nicholas; Shringarpure, Ketan; Fan, Jun; Achkir, Brice; Pan, Shuya; Hwang, Chulsoon

doi:10.1109/isemc.2013.6670527

Cited by 9 publications

(4 citation statements)

References 3 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The three de-embedding methods are only quickly summarized here, with the exception of the reformulated Hybrid method. For a detailed description of the mathematics, the reader is referred to [1] for a collection of all three methods, or [2]- [4] for each respective method.…”

Section: Summary Of Theorymentioning

confidence: 99%

See 1 more Smart Citation

De-embedding techniques for transmission lines: An application to measurements of on-chip coplanar traces

Erickson

Fan

Gao

et al. 2014

2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)

Self Cite

View full text Add to dashboard Cite

In this paper, the de-embedding study presented in [1] is extended from the simulation environment to the measurement environment; the three presented de-embedding methods are applied to measurements of on-chip coplanar traces for two different test ICs. Additionally, the Hybrid technique presented in [1] is reformulated so that only two measurement standards are required, as opposed to three. The results of deembedding the measurement data are discussed, as well as challenges with making the measurements.

show abstract

Section: Summary Of Theorymentioning

confidence: 99%

“…Further, the Hybrid method correlated very well with the LiLj method, at least up to 20 GHz, as shown in the previous section. From this point of view, the hybrid method proposed in [1] is considered at least as valid as the LiLj method.…”

Section: E Extracted Zo Of De-embedded Linementioning

confidence: 99%

De-embedding techniques for transmission lines: An application to measurements of on-chip coplanar traces

Erickson

Fan

Gao

et al. 2014

2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)

Self Cite

View full text Add to dashboard Cite

show abstract

“…The traditional open-short de-embedding method has been proven to be unsuitable to ultra-high frequencies due to its incapability for dealing with distributed nature in millimeter-wave frequency range based on assumptions of lumped equivalent circuit and ideal dummy patterns [16,17]. On the other hand, based on cascading distributive assumption, multi-line methods, including L-2L [18,19,20,21], and thru-based approaches such as thru-only [22], have been widely used for on-chip transmission line de-embedding [23,24]. The targets of the transmission line de-embedding include the determination of complex propagation constant and characteristic impedance.…”

Section: Introductionmentioning

confidence: 99%

Analysis of the parameter extraction for on-chip transmission lines

Yang

Zhang

et al. 2020

IEICE Electron. Express

View full text Add to dashboard Cite

Matching networks for ultra-high frequency chips are susceptible, and accurate extraction of passive devices parameters is essential. For on-chip transmission lines, the authors present a precise method of extracting transmission line propagation constant from two transmission line measurement structures with different lengths. After obtaining the propagation constant based on this method, to get the transmission line's characteristic impedance, this paper conducts a Y-Z model analysis of the signal pad and gives mathematical expressions. This approximation method can obtain the characteristic impedance of the transmission line without solving the signal pad's model parameters. The propagation constant and characteristic impedance derived from the methods proposed are compared with the corresponding electromagnetic simulation results, achieving fairly good agreement from 250 MHz to 110 GHz.

show abstract

“…The accuracy of a characterization method is essentially determined by the accuracy of its de-embedding algorithm. Most de-embedding methods are based on the twoline method, which measures two transmission lines of the same cross-section with different lengths [1,2,3]. For example, the two stripline test vehicles in Fig.…”

Section: Introductionmentioning

confidence: 99%

Complex permittivity extraction from PCB stripline measurement using recessed probe launch

Hwang

Park

Kam

2015

IEICE Electron. Express

Self Cite

View full text Add to dashboard Cite

A method to extract the complex permittivity of a dielectric material in a PCB is presented. The recessed probe launch allows striplines to be measured without the need of via transitions that are subject to large process variations. After pad parasitics are de-embedded using the two-line method, the complex permittivity of the dielectric is calculated from 20 MHz to 5 GHz using closed-form equations. Internal inductance is taken into account to prevent overestimation of the permittivity at low frequency.

show abstract

De-embedding techniques for transmission lines: An exploration, review, and proposal

Cited by 9 publications

References 3 publications

De-embedding techniques for transmission lines: An application to measurements of on-chip coplanar traces

De-embedding techniques for transmission lines: An application to measurements of on-chip coplanar traces

Analysis of the parameter extraction for on-chip transmission lines

Complex permittivity extraction from PCB stripline measurement using recessed probe launch

Contact Info

Product

Resources

About