Silver oxide (Ag 2 O) thin films were deposited on glass substrates using electron beam gun evaporation techniques without oxygen atmosphere. The deposited films were post annealed at 100˚C, 150˚C, and 200˚C, respectively. The surface morphologies, structural and optical properties at different annealing temperatures were studied using scanning electron microscopy (SEM), X-ray diffraction (XRD), and ultra-violet-visible spectroscopy. The XRD results show that the intensity of (200)