Dedicated beamlines for in-situ investigations of materials in reduced dimensions

Delheusy, Mélissa; Major, J.; Rühm, Adrian; Stierle, Andreas

doi:10.3139/146.110544

Cited by 5 publications

(6 citation statements)

References 44 publications

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“…X‐rays are detected with a Pilatus 100k (Dectris) for GIXRD, while the intensity during reflectivity measurements is recorded by a NaI(TI) scintillation detector. All measurements were conducted at the MPI beamline at “Angstroem Quelle Karlsruhe”, ANKA 14,15. Further details are provided in the Experimental Section.…”

Section: Resultsmentioning

confidence: 99%

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In Operando GIXRD and XRR on Polycrystalline In₅₂Pd₄₈

Ivarsson¹,

Neumann²,

Levin³

et al. 2014

Zeitschrift anorg allge chemie

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A combined approach of grazing incidence X-ray diffraction (GIXRD) and X-ray reflectivity (XRR) under in operando conditions on polycrystalline materials is presented. This approach allows tracking of material changes of amorphous or crystalline nature in the nearsurface region. Crystalline phases formed in operando can be identified by X-ray diffraction, while by XRR measurements information about the thickness and the density of overlayers is obtained. The setup also allows collection of data generated with higher incident angles which permit a direct comparison of the changes close to the surface and in

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Section: Resultsmentioning

confidence: 99%

“…All measurements were performed at the MPI beamline at the synchrotron “Angström Quelle Karlsruhe”, ANKA 14,15. A monochromatic X‐ray beam with photon energy of 10 keV corresponding to a wavelength of 1.2398 Å was used.…”

Section: Methodsmentioning

confidence: 99%

In Operando GIXRD and XRR on Polycrystalline In₅₂Pd₄₈

Ivarsson¹,

Neumann²,

Levin³

et al. 2014

Zeitschrift anorg allge chemie

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“…The fast aging process was realized with a heating plate inside an aluminum coated box to achieve dark environmental conditions with constant humidity. The X-ray measurements were performed at the MPI-MF beamline with a third-generation synchrotron ANKA (Angstrømquelle Karlsruhe) [38,39].…”

Section: Methodsmentioning

confidence: 99%

“…The beamline provided a focused X-ray beam with a high brilliance, with a spectral photon flux roughly 10 12 ph/s/0.1%bw [39]; in all experiments, the samples were illuminated with 10 keV beams, and, accordingly, a wavelength of λ = 1.239 Å was used. For the grazing incidence measurements, the sample was probed above the critical incidence angle for the films, α i = 0.175°.…”

Section: Methodsmentioning

confidence: 99%

LiF Nanoparticles Enhance Targeted Degradation of Organic Material under Low Dose X-ray Irradiation

Maye

Turak

2021

Radiation

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The targeted irradiation of structures by X-rays has seen application in a variety of fields. Herein, the use of 5–10 nm LiF nanoparticles to locally enhance the degradation of an organic thin film, diindenoperylene, under hard X-ray irradiation, at relatively low ionizing radiation doses, is shown. X-ray reflectivity analysis indicated that the film thickness increased 12.04 Å in air and 11.34 Å in a helium atmosphere, under a radiation dose of ∼65 J/cm2 for 3 h illumination with a bi-layer structure that contained submonolayer coverage of thermally evaporated LiF. This was accompanied by significant modification of the surface topography for the organic film, which initially formed large flat islands. Accelerated aging experiments suggested that localized heating was not a major mechanism for the observed changes, suggesting a photochemical mechanism due to the formation of reactive species from LiF under irradiation. As LiF has a tendency to form active defects under radiation across the energy spectrum, this could could open a new direction to explore the efficacy of LiF or similar optically active materials that form electrically active defects under irradiation in various applications that could benefit from enhanced activity, such as radiography or targeted X-ray irradiation therapies.

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“…The neutron reflectometry experiments were conducted at the FRM II, Garching, at the instrument N-REX þ [33] and at the HZB Berlin at the instrument V6 [34]. These instruments were operated at the neutron wavelengths 4.72 Å and 4.66 Å, respectively.…”

Section: Reflectometry Instrumentsmentioning

confidence: 99%