2019
DOI: 10.1021/acsenergylett.9b00709
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Deep Defect States in Wide-Band-Gap ABX3 Halide Perovskites

Abstract: Lead bromide-based halide perovskites are of interest for wide-band-gap (>1.75 eV) absorbers for low-cost solar spectrum splitting to boost solar-to-electrical energy conversion efficiency/area by adding them to c-Si or Cu(In,Ga)Se 2 PV cells and for photoelectrochemical solar fuel synthesis. Deep in-gap electronic states in PV absorbers serve as recombination centers and are detrimental for the cell's photovoltaic performance, especially for the open-circuit voltage (V oc ). We find four different deep defect… Show more

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Cited by 59 publications
(67 citation statements)
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“…The enhanced V OC deficit in PSCs employing high bromide contents is commonly observed in literature and attributed to increased recombination losses in wide‐bandgap PSCs. [ 3,51,52,75,79,81 ] Impressively, PSCs with 2D/3D heterostructure demonstrate an enhancement in V OC of ≈45 mV for all studied bandgaps compared to the 3D reference devices (Figure 1a). We mainly attribute this enhancement to reduced non‐radiative recombination losses by formation of a 2D‐RP interlayer, which passivates the surface of the 3D double‐cation perovskite layer.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The enhanced V OC deficit in PSCs employing high bromide contents is commonly observed in literature and attributed to increased recombination losses in wide‐bandgap PSCs. [ 3,51,52,75,79,81 ] Impressively, PSCs with 2D/3D heterostructure demonstrate an enhancement in V OC of ≈45 mV for all studied bandgaps compared to the 3D reference devices (Figure 1a). We mainly attribute this enhancement to reduced non‐radiative recombination losses by formation of a 2D‐RP interlayer, which passivates the surface of the 3D double‐cation perovskite layer.…”
Section: Resultsmentioning
confidence: 99%
“…[ 3,52,69,73,74 ] A common issue is photo‐induced phase segregation and subsequent funneling of charge carriers into iodide‐rich lower bandgap regions, [ 75 ] acting as radiative recombination centers. [ 68,69,74–80 ] In addition, a higher density of defect states [ 41,79,81,82 ] and stronger interfacial recombination (e.g., due to energy level offsets) [ 51,79,83–87 ] have been proposed to increase non‐radiative recombination losses. Finally, the concentration of vacancy defects and strength of phase segregation seem to be directly linked to each other.…”
Section: Introductionmentioning
confidence: 99%
“…Several techniques previously developed to understand the features of defects (energy levels and densities) in inorganic semiconductors were applied also in perovskites . These techniques include temperature‐dependent charge space limited current (SCLC), thermal admittance spectroscopy (TAS), deep‐level transient spectroscopy (DLTS), Laplace current DLTS (I‐DLTS), steady‐state photoluminescence (SSPL), time‐resolved photoluminescence (TRPL), PL mapping, time‐resolved microwave conductivity (TRMC), thermally stimulated current (TSC), capacitance‐frequency at different temperatures (C‐f), transient photocapacitance (TPC), surface photovoltage (SPV) spectroscopy, time‐resolved spectroscopies such as transient absorption and reflection techniques, ultraviolet photoemission spectroscopy (UPS), scanning tunneling microscopy (STM) . Comprehensive Reviews describing the working principles of techniques above and summarizing advantages and disadvantages can be found in Refs.…”
Section: Defects In Metal Halide Perovskitesmentioning
confidence: 99%
“…thermally stimulated current (TSC), capacitance-frequencyat different temperatures (C-f), transient photocapacitance (TPC), surface photovoltage (SPV) spectroscopy, [45] timeresolved spectroscopies such as transient absorption and reflection techniques, [46] ultraviolet photoemission spectroscopy (UPS), [42b,47] scanning tunneling microscopy (STM). [19, 25d, 48] Comprehensive Reviews describing the working principles of techniques above and summarizing advantages and disadvantages can be found in Refs.…”
Section: Defects In Metal Halide Perovskitesmentioning
confidence: 99%
“…Mehrere zuvor entwickelte Techniken zum Verständnis der Eigenschaften von Defekten (Energieniveaus und Dichten) in anorganischen Halbleitern wurden auch in Perowskiten angewendet . Diese Techniken beinhalten Messungen des temperaturabhängigen raumladungsbegrenzten Stroms (SCLC), thermische Admittanzspektroskopie (TAS), DLTS (deep‐level transient spectroscopy), Laplace‐DLTS, stationäre Photolumineszenz (SSPL), zeitaufgelöste Photolumineszenz (TRPL), PL‐Mapping, zeitaufgelöste Mikrowellenleitfähigkeit (TRMC), thermisch stimulierte Strommessungen (TSC), Kapazitäts‐Frequenz‐Messungen bei verschiedenen Temperaturen (C‐f), transiente Photokapazitätsmessungen(TPC), Oberflächen‐Photospannungs (SPV)‐Spektroskopie, zeitaufgelöste Spektroskopien wie transiente Absorptions‐ und Reflexionsmessungen, UV‐Photoemissionsspektroskopie (UPS) und Rastertunnelmikroskopie (STM) . Umfassende Übersichtsarbeiten, die die Funktionsprinzipien der oben genannten Techniken beschreiben und Vor‐ und Nachteile zusammenfassen, findet man in Lit.…”
Section: Defekte Bei Metallhalogenid‐perowskitenunclassified