2023
DOI: 10.1016/j.isci.2023.107982
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Deep learning analysis on transmission electron microscope imaging of atomic defects in two-dimensional materials

Chen Gui,
Zhihao Zhang,
Zongyi Li
et al.
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Cited by 8 publications
(1 citation statement)
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“…However, STEM images of 2D materials acquired at low voltage always have a low signal-to-noise ratio (SNR), and subsequently image analysis based on human subjective judgments may be subject to inaccuracy of structural information. Numerous studies have been conducted to develop automated analysis algorithms based on machine learning for structural identification with high accuracy [162][163][164][165][166]. The emerging 4D STEM technique is especially applicable to 2D materials, which enables the examination of electric, magnetic, and strain field structures at the atomic scale [167][168][169][170][171][172].…”
Section: Transmission Electron Microscopymentioning
confidence: 99%
“…However, STEM images of 2D materials acquired at low voltage always have a low signal-to-noise ratio (SNR), and subsequently image analysis based on human subjective judgments may be subject to inaccuracy of structural information. Numerous studies have been conducted to develop automated analysis algorithms based on machine learning for structural identification with high accuracy [162][163][164][165][166]. The emerging 4D STEM technique is especially applicable to 2D materials, which enables the examination of electric, magnetic, and strain field structures at the atomic scale [167][168][169][170][171][172].…”
Section: Transmission Electron Microscopymentioning
confidence: 99%