1997
DOI: 10.1063/1.366285
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Deep level transient spectroscopy of CdS/CdTe thin film solar cells

Abstract: Deep levels in polycrystalline n-CdS/p-CdTe photovoltaic structures have been studied by deep level transient spectroscopy ͑DLTS͒. The results were obtained from cells which have undergone different post-deposition treatment ͑as-deposited, heat treated, and heat treated in the presence of CdCl 2 ). The DLTS results showed a deep level distribution independent of the post-deposition treatment. For all samples the spectra were dominated by a hole trap, localized at E V ϩ0.48 eV. Metastable hole and electron trap… Show more

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Cited by 36 publications
(17 citation statements)
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“…A literature summary of main trapping levels in CdTe/CdS cells is reported recently. 23 This work shows that both of the traps in our sample have been detected previously by deep level transient spectroscopy as electron traps. The E 2 trap that appears to be more common to detect 23 can be assigned to the interface states.…”
Section: E Deep Energy Levelssupporting
confidence: 74%
“…A literature summary of main trapping levels in CdTe/CdS cells is reported recently. 23 This work shows that both of the traps in our sample have been detected previously by deep level transient spectroscopy as electron traps. The E 2 trap that appears to be more common to detect 23 can be assigned to the interface states.…”
Section: E Deep Energy Levelssupporting
confidence: 74%
“…This trap level with its σ t ~1.1×10 −13 cm 2 , was detected respectively in CdTe thin-film solar cells after treatment with CdCl 2 using DLTS measurements by Lourenço and Versluys [19,20]. In addition, Fiederle verified trap Cd i 2+ with value E v +0.51(±0.01) eV in crystal CdTe thin-film [21].…”
Section: Resultsmentioning
confidence: 92%
“…Three defect energy levels have been verified from the AS data, as summarized in [17,18]. The energy value was also founded in semiconductor CdTe thin-film [16,17], and CdTe thin-film solar cells undergone different post-deposition thermal treatment through DLTS by Lourenço [19], with its σ t close to 6.9×10 −16 cm 2 .…”
Section: Resultsmentioning
confidence: 99%
“…After stressing of a cell this level shifts into the band gap by 0.22eV [17]. The H1 level of energy about Ev+0.35 eV was previously reported for the ED-grown, CSS-grown CdTe devices [11,12,18,20,21] and p-CdTe single crystals [10,12,22]. Usually it is attributed to Cu Cd substitution defects.…”
Section: Deep-level Transient Spectroscopy (Dlts)mentioning
confidence: 99%