2003
DOI: 10.1116/1.1629289
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Defect analysis in thermal nanoimprint lithography

Abstract: The fracture defect of the polymer in thermal nanoimprint lithography is studied based on numerical simulation and experiments. Hot pressing, cooling, and releasing steps in nanoimprint lithography are investigated in detail by a numerical simulation study. The applied pressure after the polymer deformation below the glass transition temperature will induce a stress concentration at the corner of the polymer pattern. On the other hand, the difference of the thermal expansion coefficients between the mold and t… Show more

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Cited by 169 publications
(114 citation statements)
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“…Replication methods would be the preferred technology for the development of such structures, allowing their mass production. However, the requirements of PNFs with HAR are challenging for standard masters and replication methods [39][40][41] . This is not only because of the HAR needed for achieving low optical losses but also because of the required low residual layers of o 1 μm.…”
Section: High-aspect-ratio Microstructures (Harms)mentioning
confidence: 99%
See 1 more Smart Citation
“…Replication methods would be the preferred technology for the development of such structures, allowing their mass production. However, the requirements of PNFs with HAR are challenging for standard masters and replication methods [39][40][41] . This is not only because of the HAR needed for achieving low optical losses but also because of the required low residual layers of o 1 μm.…”
Section: High-aspect-ratio Microstructures (Harms)mentioning
confidence: 99%
“…Si moulds were initially prepared for thermal NIL (T-NIL) with thin layers of PMMA, which is the classical process for achieving low residual layers in thermoplastic polymer resists 39,42,49 . However, thermal processes with non-crosslinked materials impose high stress on the material and often result in ripping during demoulding.…”
Section: Nanoimprint Lithographymentioning
confidence: 99%
“…A vast body of research has focus on mechanical characteristics such as the template release load. The stress mechanism of the resist and template and the reasons for defects were analyzed [2][3][4]. To suppress the release load and eliminate defects, using novel mold with low surface energy materials [5], increased performance of the resist [6], structure modification or novel template release methods have been proposed [7][8][9][10].…”
Section: Introductionmentioning
confidence: 99%
“…This step is the key feature of this approach; in contrast to conventional nanoimprint lithography whereby fine, high-aspect ratio molds or mold features are the most costly, in sacrificial imprint, they are the least expensive portion of the structure and are designed to be destroyed during processing. This feature is critical for the scalable incorporation of nanostructured surfaces into three-dimensional (3D) multiscale devices; it also avoids the issue of resist fracture that is ubiquitous in thermal nanoimprinting 21 , whereby thermal expansion mismatch leads to gripping of the structures during cooling and subsequent failure by tear-away of either the imprinted material or the mold. Avoiding damage to the resist is particularly problematic in high-aspect ratio structures due to the nature of stress concentration.…”
Section: Introductionmentioning
confidence: 99%