Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique

Abstract

In this paper, a feature termed as the postpeak value is proposed for the pulsed eddy current technique (PECT). Moreover, a method using the postpeak value is proposed to classify surface and reverse defects. A PECT system is built for verification purposes. Experiment results prove that the postpeak feature value has better performance than that of the traditional peak value in the case of reverse defect detection. In contrast, the peak value is better than the postpeak value in the case of surface defect detection. Experiment results also validate that the proposed classification algorithm has advantages: classification can be achieved in real time, the calculation process and results are easy to understand, and supervised training is unnecessary.