2022
DOI: 10.3390/electronics11101561
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Defect Detection for Metal Base of TO-Can Packaged Laser Diode Based on Improved YOLO Algorithm

Abstract: Defect detection is an important part of the manufacturing process of mechanical products. In order to detect the appearance defects quickly and accurately, a method of defect detection for the metal base of TO-can packaged laser diode (metal TO-base) based on the improved You Only Look Once (YOLO) algorithm named YOLO-SO is proposed in this study. Firstly, convolutional block attention mechanism (CBAM) module was added to the convolutional layer of the backbone network. Then, a random-paste-mosaic (RPM) small… Show more

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Cited by 25 publications
(10 citation statements)
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“…Before the backbone network conducts feature extraction, the input data undergoes enhancement through Mosaic [26] and Mixup [27]. To enhance network robustness, nine images are stitched into a single image through random scaling, cropping, and scheduling.…”
Section: Stae-yolo Network Modelmentioning
confidence: 99%
“…Before the backbone network conducts feature extraction, the input data undergoes enhancement through Mosaic [26] and Mixup [27]. To enhance network robustness, nine images are stitched into a single image through random scaling, cropping, and scheduling.…”
Section: Stae-yolo Network Modelmentioning
confidence: 99%
“…It can be inferred from the above research that the biggest problem of the current product defect detection method is the contradiction between detection accuracy and detection speed. To achieve real-time detection while improving detection accuracy, Jiayi Liu [27] proposed to improve the convolutional layer of the backbone network and reduce the sensitivity to the initial clustering center, which can achieve fast detection while ensuring the correct rate of detection classification.…”
Section: Related Workmentioning
confidence: 99%
“…Lee and Hwang [ 22 ] proposed a novel YOLO architecture with adaptive frame control to solve the real‐time processing of objects using network cameras, which provides efficient guidelines for appropriate hardware platform selection. To detect the appearance defects of transistor outline package laser diodes, Liu et al [ 23 ] improved the YOLO algorithm in three aspects: adding a convolutional block attention mechanism module, proposing a random‐paste‐mosaic small object data augmentation module, and applying the K‐means++ clustering algorithm. Xu et al [ 24 ] developed a lightweight DL detector for an on‐board ship detection method based on YOLOv5 in large‐scene sentinel‐1 synthetic aperture radar images to reduce the detection model volume and floating‐point operations.…”
Section: Introductionmentioning
confidence: 99%