2015
DOI: 10.14738/tmlai.36.1551
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Defect Detection in Fabric using Wavelet Transform and Genetic Algorithm

Abstract: Fabric defect detection is one of the indispensable units in the manufacturing industry to maintain the quality of the end product. Wavelet transform is well suited for quality inspection application due to its multi-resolution representation and to extract fabric features. In this paper a new scheme is proposed for fabric defect detection in textile industry. For this purpose, all coefficients were extracted from perfect fabric. These coefficients can defect main fabric image & indicate defects of fabric text… Show more

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Cited by 3 publications
(2 citation statements)
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“…However, this method does not generalize well for some slightly complex patterned textures. Harinath et al [ 14 ] proposed a wavelet transform-based method for fabric defect detection, which is well suited for quality inspection due to its multi-resolution feature extraction. However, similar spectral approaches are usually computationally demanding.…”
Section: Introductionmentioning
confidence: 99%
“…However, this method does not generalize well for some slightly complex patterned textures. Harinath et al [ 14 ] proposed a wavelet transform-based method for fabric defect detection, which is well suited for quality inspection due to its multi-resolution feature extraction. However, similar spectral approaches are usually computationally demanding.…”
Section: Introductionmentioning
confidence: 99%
“…This method is not efficient in detecting low‐contrast fabrics and patterned fabrics. The spectral methods [8, 9], widely used in the study of fabric defects, highlight the differences between defective and defect‐free regions in the frequency domain, which can effectively realise the detection of fabrics with a simple background. Typical spectral methods include Fourier transform, wavelet transform [10], and Gabor transform [11].…”
Section: Introductionmentioning
confidence: 99%