Defect detection through customised reduction and hybrid convolution classification over super-pixel clusters

Samson, Matthew Immanuel

doi:10.1504/ijris.2022.123391

IJRIS

2022

DOI: 10.1504/ijris.2022.123391

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Defect detection through customised reduction and hybrid convolution classification over super-pixel clusters

Matthew Immanuel Samson¹

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Defect detection through customised reduction and hybrid convolution classification over super-pixel clusters

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