Defect diagnosis algorithms for a field programmable interconnect network embedded in a Very Large Area Integrated Circuit

Sion, Gontran; Blaquiere, Yves; Savaria, Yvon

doi:10.1109/iolts.2015.7229837

2015 IEEE 21st International on-Line Testing Symposium (IOLTS) 2015

DOI: 10.1109/iolts.2015.7229837

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Defect diagnosis algorithms for a field programmable interconnect network embedded in a Very Large Area Integrated Circuit

Gontran Sion

Yves Blaquiere

Yvon Savaria

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Cited by 3 publications

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Defect diagnosis algorithms for a field programmable interconnect network embedded in a Very Large Area Integrated Circuit

Cited by 3 publications

References 8 publications

A novel spatially configurable differential interface for an electronic system prototyping platform

A novel spatially configurable differential interface for an electronic system prototyping platform

Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits

A pattern-based routing algorithm for a novel electronic system prototyping platform

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