1978
DOI: 10.1515/zna-1978-1107
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Defect Diffusion Models in NMR and Dielectric Relaxation

Abstract: The effect of diffusing defects such as vacancies, displacements, torsions, and rotational isomers on the nm r and dielectric relaxation behaviour is treated under various aspects. The influences of the dimensionality of the diffusion process, of the mutual hindrance, of the defect concentration, of the defect length and of the mean lifetime are derived and discussed.

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Cited by 36 publications
(14 citation statements)
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“…However, defects "store" length and this means that the annihilation of a defect in a chain embedded in a more or less static matrix requires the correlated creation of a new defect nearby. This is at least a probability statement permitting the assumption of the quasi-stable defects postulated in many defect diffusion models [6], [32].…”
Section: Technical Details and Sample Characterizationmentioning
confidence: 89%
See 3 more Smart Citations
“…However, defects "store" length and this means that the annihilation of a defect in a chain embedded in a more or less static matrix requires the correlated creation of a new defect nearby. This is at least a probability statement permitting the assumption of the quasi-stable defects postulated in many defect diffusion models [6], [32].…”
Section: Technical Details and Sample Characterizationmentioning
confidence: 89%
“…With the data of figure 2, we virtually have the spectral density of the y-process. This information prompted us to extend the kink/ crankshaft model to a defect diffusion model with non-Markovian statistics [6]. Previously we also could show that a mechanism of this type completely describes the T,-dispersion of diplamitoyl-lecithin bilayers at 0 ~ i.e.…”
Section: Y-process Of Amorphous Polyethylenementioning
confidence: 98%
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“…When the rates are high such that many individual jumps occur during the Larmor period 0 1 ω − , the NSLR can be related to a continuous diffusion [18]. On the other hand, when individual ion jumps modulate the local field at a frequency comparable with or lower than ω 0 , the NSLR is analyzed on the basis of hopping models [19].…”
Section: Effects Of Lithium Ionic Motion On 7 LI Line-shape and Spinlmentioning
confidence: 99%