of organic semiconductors show carrier mobility in excess of 5 cm 2 V −1 s −1 when employed as active materials in long (>10 μm) channel organic thin fi lm transistors (OTFT). [2][3][4][5][6][7][8][9][10][11][12] Therefore by scaling the channel length down to 10-1 μm, in principle OTFTs should be able to operate at relatively high (1-10 MHz) frequencies at reasonable (<10 V) applied voltages. [ 13 ] In practice, apart from some reports, [13][14][15][16][17][18][19][20][21][22] this is often not easy to achieve because of injection issues: [ 23,24 ] contact resistances tend to become dominant over the channel resistance in short channel transistors reducing the expected improvement of device performances. [ 25 ] This situation is severely limiting the range of applications for OTFTs. [ 26 ] Indeed contact resistances arise from contact/semiconductor interface properties hence they are not expected to scale with the transistor channel length. To address this issue not only suitable modifi cations of the contact/semiconductor interface aimed at enhancing the contact injecting properties have to be implemented, [ 27 ] but also the device topology has to be considered. Staggered OTFTs, where the contacts and the transistor channel do not lie in the same plane, are usually characterized by lower contact resistances than coplanar ones: [ 28 ] while in these latter the injection area is limited by the accumulated channel depth (few nanometers), in the former the overlap between gate and source/drain contacts (many micrometers or even tens of micrometers) can be exploited, as shown in Figure 1 . The gate/contact overlapping length has to be suitably engineered: on the one hand it should be large enough to accommodate the injected current and to minimize contact resistances; but on the other hand it should not be too large because overlapping areas not effectively involved in injection solely result in additional parasitic capacitances that deteriorate the device speed. [ 13,29 ] It is therefore important to quantify the injection length, which is the length over which sizeable carrier injection occurs. [ 30,31 ] Despite the large number of studies on contact effects in OTFTs, [ 24,32 ] few of them discuss the effect of the gate to contact overlap: Xu et al. found a relationship between the optimal contact length and the semiconductor thickness in staggered OTFT. [ 33 ] Park et al. found that threshold voltage, fi eld effect mobility and contact resistances are affected by the contact length in staggered OTFT; [ 34 ] Wang et al. simulated the effect of contact length scaling. [ 35 ] Ante et al. studied the effect of contact In staggered thin fi lm transistors, the injection length is the fraction of the gate to contact overlap that is effectively involved in current injection. Its assessment is important to properly downscale device dimensions. In fact, in order to increase transistor operation speed, the whole device footprint should be downscaled, which means both the gate to contact overlap and the channel length, as ...