2007
DOI: 10.1103/physrevb.76.184112
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Defect healing at room temperature in pentacene thin films and improved transistor performance

Abstract: We report on a healing of defects at room temperature in the organic semiconductor pentacene. This peculiar effect is a direct consequence of the weak intermolecular interaction which is characteristic of organic semiconductors. Pentacene thin-film transistors were fabricated and characterized by in situ gated four-terminal measurements. Under high vacuum conditions (base pressure of order 10 −8 mbar), the device performance is found to improve with time. The effective field-effect mobility increases by as muc… Show more

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Cited by 71 publications
(64 citation statements)
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“…charge transport has been proposed and widely accepted, 13,14 and there have been many attempts to determine the trap density of states (trap DOS). However, the trap DOS has been analyzed mainly for p-channel materials, [13][14][15][16][17][18][19][20] and comparatively limited works have been done for n-channel materials. 15,[21][22][23] In particular, the trap DOS has not been systemically studied from the viewpoint of the basic transistor operation.…”
Section: Introductionmentioning
confidence: 99%
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“…charge transport has been proposed and widely accepted, 13,14 and there have been many attempts to determine the trap density of states (trap DOS). However, the trap DOS has been analyzed mainly for p-channel materials, [13][14][15][16][17][18][19][20] and comparatively limited works have been done for n-channel materials. 15,[21][22][23] In particular, the trap DOS has not been systemically studied from the viewpoint of the basic transistor operation.…”
Section: Introductionmentioning
confidence: 99%
“…Lang et al have extracted the trap DOS from the Arrhenius plot of the transconductance for single-crystal pentacene transistors, 32,33 and similar analysis has been applied to other thin-film organic semiconductors. 15,16 In addition, a variety of methods to calculate the trap DOS have been investigated, and an exponential distribution of the DOS has been established in pentacene thin-film transistors, [17][18][19] and in single crystal transistors. 20 The DOS distribution has been also extracted from space-charge-limited-current spectroscopy and Kelvin probe microscopy.…”
Section: Introductionmentioning
confidence: 99%
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“…[10][11][12][13][14][15][16][17] Kalb et al have analysed organic transistors based on these methods and proved that various methods afford approximately consistent exponential trap distribution. [24][25][26][27][28] Although Lang's analysis has been extensively used due to its simpleness for (4)). The free carriers Q f are activated from E F to the interface E c according to Eq.…”
Section: Introductionmentioning
confidence: 99%
“…This is likely to be originated from the interface charges between the pentacene layer and the cowl-shaped nanostructures. Considering that the flat band voltage (VFB) can be approximated to the onset voltage (V onset ) of the device [13], the density of trapped holes can be estimated using C ins (ΔV TH −ΔV FB )/q because V TH above V onset is an estimate of the trap density in the channel [14], where Cinsis the capacitance of gate insulator; using this approach, the density of trapped holes was found to be about 2.4×10 11 cm −2 .It is presumed that polyurethane molecules might induce an energetic disorder at the interface. Further investigation is required to elucidate the origin of such interface charges.…”
mentioning
confidence: 99%