2024
DOI: 10.7717/peerj-cs.1900
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Defect identification of bare printed circuit boards based on Bayesian fusion of multi-scale features

Xixi Han,
Renpeng Li,
Boqin Wang
et al.

Abstract: The aim of this article is to propose a defect identification method for bare printed circuit boards (PCB) based on multi-feature fusion. This article establishes a description method for various features of grayscale, texture, and deep semantics of bare PCB images. First, the multi-scale directional projection feature, the multi-scale grey scale co-occurrence matrix feature, and the multi-scale gradient directional information entropy feature of PCB were extracted to build the shallow features of defect image… Show more

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