Defect‐induced electrostatic charging of nitrogen films

Abstract

Electrostatic charging of nanostructured N2 films was studied employing optical and a current set of emission spectroscopy methods: cathodoluminescence CL, thermally and photon‐stimulated exoelectron emission TSEE, PSEE as well as thermally and photon‐stimulated luminescence TSL, PSL. Concurrently with thermally stimulated yield of electrons the yield of nitrogen particles was detected, so‐called “postdesorption.” An enhancement of the optical emission stemmed from the neutralization reaction N4+ + e → N2* + N2* → N2 + N2 + hν was observed with an exposure to an electron beam. The experiments performed with a variable voltage applied to an electrode for current detection demonstrated significant accumulation of negative charge. The TSEE current in the low‐temperature range was detected at negative voltages up to −30 V. An accumulation of trapped electrons (up to 1016 cm−3) was detected. A possible contribution of N3− in electrostatic charging was assumed. Thermally stimulated yield of negatively charged particles from a N2 film subjected to an electron beam.