1996
DOI: 10.1109/43.541448
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Defect level evaluation in an IC design environment

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Cited by 38 publications
(13 citation statements)
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“…In [Sousa et al , 1996] it is suggested that the reason why the Williams-Brown formula combined with the stuck-at fault coverage T cannot track experimental fallout data is the fact that, unlike T, in the real fault coverage 0 each fault should be weighted with its probability of occurrence. In [Sousa et al, 1994] it is shown by extensive simulation of more accurate fault models that different weighting of the faults produce different non-linear relationships between 0 and T, which would explain the real shape of DL(T) curves.…”
Section: For This Distribution the Yieldmentioning
confidence: 99%
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“…In [Sousa et al , 1996] it is suggested that the reason why the Williams-Brown formula combined with the stuck-at fault coverage T cannot track experimental fallout data is the fact that, unlike T, in the real fault coverage 0 each fault should be weighted with its probability of occurrence. In [Sousa et al, 1994] it is shown by extensive simulation of more accurate fault models that different weighting of the faults produce different non-linear relationships between 0 and T, which would explain the real shape of DL(T) curves.…”
Section: For This Distribution the Yieldmentioning
confidence: 99%
“…In [Sousa et al, 1994] it is shown by extensive simulation of more accurate fault models that different weighting of the faults produce different non-linear relationships between 0 and T, which would explain the real shape of DL(T) curves. The c1ustering effect is briefty mentioned in [Sousa et al , 1996] but its fundamental importance is not realized.…”
Section: For This Distribution the Yieldmentioning
confidence: 99%
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“…Detecting all manufacturing defects by production test is of great difficulty in IC manufacturing process, and thus it is important to predict precisely the incidence of field failure due to overlooked defects, in order to estimate design and manufacturing costs [1][2][3][4]. Conventional schemes for field failure rate estimation may include, for example, the following classic formula [2] based on yield Y and production test quality f :…”
Section: Introductionmentioning
confidence: 99%
“…Layout-aware derivation is one of the ways to improve accuracy of estimated fault coverage [3]. Authors have evaluated effectiveness of weighted bridge fault coverage where incidence rate of each fault is weighted by critical area which is derived by commercial tool with multiple defect size [10].…”
Section: Introductionmentioning
confidence: 99%