2014
DOI: 10.1364/ome.4.002542
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Defect modes in a one-dimensional photonic crystal with a chiral defect layer

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Cited by 33 publications
(10 citation statements)
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“…The optical properties of the resulting samples were then characterized experimentally by a combination of steady state and time‐resolved fluorescence spectroscopies. The results were analyzed with a theoretical approach relying on the combination of the invariant imbedding method and the finite‐difference time‐domain (FDTD) method . With these tools, we calculated the spontaneous emission rate and the Purcell factor as a function of the distance between the dye‐polymer film and the top metal layer of the HMM substrates.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The optical properties of the resulting samples were then characterized experimentally by a combination of steady state and time‐resolved fluorescence spectroscopies. The results were analyzed with a theoretical approach relying on the combination of the invariant imbedding method and the finite‐difference time‐domain (FDTD) method . With these tools, we calculated the spontaneous emission rate and the Purcell factor as a function of the distance between the dye‐polymer film and the top metal layer of the HMM substrates.…”
Section: Resultsmentioning
confidence: 99%
“…As detailed in the Supporting Information, in order to obtain the exact values of r s and r p of the HMM structures, we employed the invariant imbedding method for the electromagnetic wave propagation in the HMM structures. The equations of the reflection coefficients r s and r p are obtained and integrated for each thickness of the HMM top dielectric layer . With this approach, any dipole orientation, defined as γ, is considered as a linear combination of parallel and perpendicular dipole components.…”
Section: Resultsmentioning
confidence: 99%
“…To explore standing-wave contributions, we calculated the optical-field-intensity distribution, | F | 2 , i.e., the light intensity, in the Donor:Acceptor films and the composite nanostructures using invariant imbedding method 29 , 57 , 58 and optical constants measured by ellipsometry. Figure 3a–c present | F | 2 as a function of the wavelength for three substrates.…”
Section: Resultsmentioning
confidence: 99%
“…Also, there are a large number of papers devoted to this phenomenon where the frequency of this defect mode is adjusted by applying static magnetic field [11,12]. In addition, the combination of periodic band gap structures with such type of structures as graphene or chiral elements has been considered extensively [10,13].…”
Section: Introductionmentioning
confidence: 99%