2022 IEEE 4th International Conference on Power, Intelligent Computing and Systems (ICPICS) 2022
DOI: 10.1109/icpics55264.2022.9873594
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Defect Recognition Method based on Fusion Learning of Multi-layer Image Features

Ying Xu
1
,
Zeliang Li
2
,
Ziyi Jiang
3
et al.
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