2003
DOI: 10.1016/s0040-6090(03)00188-3
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Defect spectra in epitaxial CuInSe2 grown by MOVPE

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Cited by 29 publications
(16 citation statements)
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“…The primary differences in these samples are growth temperature (60°C lower for UIUC-2) and composition (closer to stoichiometry for UIUC-2). The shallow emission energies are much farther from the band edge (150-260 meV) than is usually observed in CIS epitaxial layers [17], but are comparable to separations observed in the polycrystalline samples studied here. Comparing the spectra suggests that the deep defect response does not originate from grain boundaries, but is characteristic of the bulk material, as expected from the high performance devices made from polycrystalline materials as compared to those made from single crystal materials.…”
Section: Resultssupporting
confidence: 80%
“…The primary differences in these samples are growth temperature (60°C lower for UIUC-2) and composition (closer to stoichiometry for UIUC-2). The shallow emission energies are much farther from the band edge (150-260 meV) than is usually observed in CIS epitaxial layers [17], but are comparable to separations observed in the polycrystalline samples studied here. Comparing the spectra suggests that the deep defect response does not originate from grain boundaries, but is characteristic of the bulk material, as expected from the high performance devices made from polycrystalline materials as compared to those made from single crystal materials.…”
Section: Resultssupporting
confidence: 80%
“…For the reference samples A and B a single asymmetric peak is observed at 0.972 eV for CISe and at 1.600 eV for CGSe. These values are typical for Cu‐poor material14, 19 and correspond to defect related emission. The peak positions and full widths at half maximum (FWHM) are in good agreement with previous studies14, 19 for samples with similar [Cu]/([In]+[Ga]) ratios.…”
Section: Resultsmentioning
confidence: 77%
“…These values are typical for Cu‐poor material14, 19 and correspond to defect related emission. The peak positions and full widths at half maximum (FWHM) are in good agreement with previous studies14, 19 for samples with similar [Cu]/([In]+[Ga]) ratios. The asymmetric line shape was previously assigned to broadened defect energies due to the high density of defects and compensation, and resulting potential fluctuations 14, 19.…”
Section: Resultsmentioning
confidence: 77%
“…Therefore: yes, we do need another PL study on CuInSe 2 with material grown under the same conditions as the material used in our PL study of CuGaSe 2 , with a comprehensive accounting for the compositional, temperature and intensity dependencies. First results of this study have been published before [17]. Here we give a much more detailed description of the spectra in every aspect: their change with composition, with temperature and with intensity.…”
Section: Introductionmentioning
confidence: 99%