To clarify the proton energy dependence of proton irradiation damage in GaAs materials, intrinsic and Si-doped GaAs were irradiated with 100 keV and 2 MeV protons at different fluences. The evolution of lattice defects and optical properties of GaAs were analyzed by Raman spectroscopy, XRD spectroscopy, and photoluminescence spectroscopy. The results of Raman and XRD results show that the structures of the intrinsic GaAs and Si-doped GaAs does not change much after proton irradiation, which exhibits excellent radiation resistance. At the same time, the Raman results also prove that the radiation resistance of structural stability of Si-doped GaAs is lower than that of the intrinsic GaAs. However, in contrast to the structural properties, the optical properties of intrinsic GaAs degrade severely after irradiation in the PL spectrum, indicating that the optical properties of Si-doped GaAs are more stable than intrinsic GaAs. This is due to the changes of the light-emitting mechanism for Si-doped GaAs. In addition, the Raman and PL results also confirm that the damage produced by protons at 100 keV is greater than 2 MeV, which is consistent with the SRIM simulation.